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Image Search Results
Journal: Materials
Article Title: Microstructure and Mechanical Performance of PBF-LB/M 316L Stainless Steel
doi: 10.3390/ma18122720
Figure Lengend Snippet: EBSD analysis for 0.07 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.
Article Snippet: SEM (Sigma 30, Carl Zeiss, Oberkochen, Germany) was used to analyze surface and cross-sectional microstructures, while the
Techniques:
Journal: Materials
Article Title: Microstructure and Mechanical Performance of PBF-LB/M 316L Stainless Steel
doi: 10.3390/ma18122720
Figure Lengend Snippet: EBSD analysis for 0.11 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.
Article Snippet: SEM (Sigma 30, Carl Zeiss, Oberkochen, Germany) was used to analyze surface and cross-sectional microstructures, while the
Techniques:
Journal: Materials
Article Title: Microstructure and Mechanical Performance of PBF-LB/M 316L Stainless Steel
doi: 10.3390/ma18122720
Figure Lengend Snippet: EBSD analysis for 0.15 mm: ( a ) grain boundaries, ( b ) IPF, ( c ) KAM, and ( d ) grain distribution.
Article Snippet: SEM (Sigma 30, Carl Zeiss, Oberkochen, Germany) was used to analyze surface and cross-sectional microstructures, while the
Techniques:
Journal: Nanomaterials
Article Title: Effect of Ultrasonic Surface Rolling Process on the Hot Compression Behavior of Inconel 718 Superalloy at 700 °C
doi: 10.3390/nano9040658
Figure Lengend Snippet: Optical and electron back-scattered diffraction (EBSD) maps of the USRP-treated samples prior to hot compression test: ( a ) Optical map, ( b ) EBSD map of all Euler angles, ( c ) Local mis-orientation (LM) map.
Article Snippet: A Zeiss Ultra 55 scanning electron microscope (SEM) with electron back-scattered
Techniques: